login

Search documents

Browse topics

Document details

 
Title:
 
Contactless Determination of Dielectric Absorption from the Spectral Response of Photoluminescence
 
Author(s):
 
M.K. Juhl, M.E. Pollard, A.R. Paduthol, A. Gentle, T. Trupke, Z. Hameiri
 
Keywords:
 
Photoluminescence, Spectral Response, Absorption, Characterisation, Characterization
 
Topic:
 
Silicon Photovoltaics
Subtopic: Characterisation & Simulation Methods
Event: 33rd European Photovoltaic Solar Energy Conference and Exhibition
Session: 2AO.5.3
 
Pages:
 
266 - 270
ISBN: 3-936338-47-7
Paper DOI: 10.4229/EUPVSEC20172017-2AO.5.3
 
Price:
 
 
0,00 EUR
 
Document(s): paper
 

Abstract/Summary:


Light absorption within a solar cell's dielectric coatings represents a loss mechanism that proves challenging to measure, particularly at short wavelengths at which the substrate is strongly absorbing. This paper presents a method based on measurements of the spectral response of photoluminescence that determines a relative measure of the absorption in a dielectric coating. The use of the spectral response of photoluminescence is suggested as it is a contactless and non-destructive technique that can be applied to a solar cell at any stage of production. The absorptance determined from this method is compared to ellipsometry measurements on polished samples, and is then used to determine the absorptance of a silicon nitride layer on the textured surface of a screen printed solar cell.