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Contactless Determination of Dielectric Absorption from the Spectral Response of Photoluminescence
M.K. Juhl, M.E. Pollard, A.R. Paduthol, A. Gentle, T. Trupke, Z. Hameiri
Photoluminescence, Spectral Response, Absorption, Characterisation, Characterization
Silicon Photovoltaics
Subtopic: Characterisation & Simulation Methods
Event: 33rd European Photovoltaic Solar Energy Conference and Exhibition
Session: 2AO.5.3
266 - 270
ISBN: 3-936338-47-7
Paper DOI: 10.4229/EUPVSEC20172017-2AO.5.3
0,00 EUR
Document(s): paper


Light absorption within a solar cell's dielectric coatings represents a loss mechanism that proves challenging to measure, particularly at short wavelengths at which the substrate is strongly absorbing. This paper presents a method based on measurements of the spectral response of photoluminescence that determines a relative measure of the absorption in a dielectric coating. The use of the spectral response of photoluminescence is suggested as it is a contactless and non-destructive technique that can be applied to a solar cell at any stage of production. The absorptance determined from this method is compared to ellipsometry measurements on polished samples, and is then used to determine the absorptance of a silicon nitride layer on the textured surface of a screen printed solar cell.