Title: |
Qualification Testing versus Quantitative Reliability Testing of PV – Gaining Confidence in a Rapidly Changing Technology |
Author(s): |
S.R. Kurtz, K. Whitfield, N. Phillips, T. Sample, C. Monokroussos, E. Hsi, I. Repins, P. Hacke, D. Jordan, J. Wohlgemuth, P. Seidel, U. Jahn, M. Kempe, T. Tanahashi, Y. Chen, B. Jäckel, M. Yamamichi |
Keywords: |
Accelerated Testing, Risk Assessment, PV Reliability, Lifetime Prediction |
Topic: |
Performance, Reliability and Sustainability of Photovoltaic Modules and Balance of System Components |
Subtopic: | PV Module Performance and Reliability |
Event: | 33rd European Photovoltaic Solar Energy Conference and Exhibition |
Session: | 5DP.1.2 |
Pages: |
1302 - 1311 |
ISBN: | 3-936338-47-7 |
Paper DOI: | 10.4229/EUPVSEC20172017-5DP.1.2 |
Price: |
0,00 EUR |
Document(s): |
paper |