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Quantitative Mapping of PV Modules Performance Using Electroluminescence Based Imaging
G. El Hajje, J. Dupuis, P. Dupeyrat
Electroluminescence, Reciprocity, PV Module, Experimental Methods
Photovoltaic Modules and BoS Components
Subtopic: PV Module Design, Manufacture, Performance and Reliability
Event: 36th European Photovoltaic Solar Energy Conference and Exhibition
Session: 4CO.1.1
849 - 853
ISBN: 3-936338-60-4
Paper DOI: 10.4229/EUPVSEC20192019-4CO.1.1
0,00 EUR
Document(s): paper


In the present study, we develop a characterization methodology allowing to directly convert standard electroluminescence (EL) images of a given PV module into absolute quantitative performance maps. The experiments and results were obtained based on polycrystalline silicon modules. After acquiring two EL images, we show that by applying the generalized reciprocity relations, it is possible to optically extract key performance indicator maps. We demonstrate the ability to extract an optical I-V characteristics whereby we optically map the current collection efficiency and the series resistance, across the studied polycrystalline modules. The results were finally validated by comparing the mean central values extracted from the optically determined maps with the values extracted from electrical I(V) measurements. Such agreement provides an initial evidence for the potential of the presented methodology to provide fast quantitative screening of PV module performances for industrial applications.