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Title:
 
From Degradation Kinetics in PV Modules to Residual Lifetime Prognostics
 
Author(s):
 
H. Hieber, H. Gropius
 
Topic:
 
Photovoltaic Modules and BoS Components
Subtopic: PV Module Design, Manufacture, Performance and Reliability
Event: 36th European Photovoltaic Solar Energy Conference and Exhibition
Session: 4AV.1.58
 
Pages:
 
1102 - 1105
ISBN: 3-936338-60-4
Paper DOI: 10.4229/EUPVSEC20192019-4AV.1.58
 
Price:
 
 
0,00 EUR
 
Document(s): paper
 

Abstract/Summary:


Long term reliability of PV modules in the field is tested in a short-term stress test to assess a figure of merit concerning the expectable power development for ensembles of polycrystalline silicon and thinfilm modules. For this investigation the samples of different technologies and producers are selected as statistically representatives in 2 groups each with and without visible defects. The modules are subjected to continuous light tests using a solar simulator. The zero-load voltage VOC and the short-circuit current SCC are continuously measured. The transient functions of the VOC and the SCC typically show a heavy-tail relaxation behaviour. The separation of the transients from the irreversible drift rates results in probability density plots. Added are the frequency functions of the visible defects due to corrosion and delamination phenomena. The practical advantage of this model for failure expectation values as a function of the combination of the photoelectrical load, mechanical cycling, and corrosion kinetics is that the number and the time consumption of test runs can be significantly reduced with increased accuracy of the lifetime prediction.