Title: |
Non-Destructive Approach for Measuring Base Resistivity of Emitter-Diffused, Partially-Processed Wafers Using Temperature-Stage QSSPC |
Author(s): |
V. Kuruganti, J. Haunschild, A. Brand, S. Al-Hajjawi, S. Rein, S.W. Glunz |
Keywords: |
Etching, Passivation, Characterisation, Characterization, Silicon |
Topic: |
Silicon Materials and Cells |
Subtopic: | Characterisation & Simulation of Si Cells |
Event: | 36th European Photovoltaic Solar Energy Conference and Exhibition |
Session: | 2CV.2.44 |
Pages: |
361 - 365 |
ISBN: | 3-936338-60-4 |
Paper DOI: | 10.4229/EUPVSEC20192019-2CV.2.44 |
Price: |
0,00 EUR |
Document(s): |
paper |