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Title:
 
Angular Response Measurement of Thin-Film PV Modules with Solar Simulators
 
Author(s):
 
W. Herrmann, S. Schaaf, L. Rimmelspacher, J.B. Castro
 
Keywords:
 
Performance, Energy Yield, Angular Response
 
Topic:
 
Photovoltaic Modules and BoS Components
Subtopic: PV Module Design, Manufacture, Performance and Reliability
Event: 36th European Photovoltaic Solar Energy Conference and Exhibition
Session: 4AV.2.27
 
Pages:
 
1192 - 1196
ISBN: 3-936338-60-4
Paper DOI: 10.4229/EUPVSEC20192019-4AV.2.27
 
Price:
 
 
0,00 EUR
 
Document(s): paper
 

Abstract/Summary:


Besides the low-irradiance behavior and the temperature behavior, the angular transmittance of a photovoltaic (PV) module is a determining factor for its energy yield performance. The angular loss increases with the Angle of Incidence (AoI) and is described by the Incident Angle Modifier (IAM), which is the ratio of the PV device short circuit current (normalized to its Isc at normal incidence) and the cosine of AoI. Procedures for IAM measurement in the angular range of ±80° under natural sunlight and simulated sunlight are defined in the standard IEC 61853-2. In previous work, a solar simulator test method for full-size c-Si PV modules has been developed. It has been demonstrated that the IAM measurement must be related to the dimensions of a single solar cell to meet the technical requirements of IEC 61853-2. As single cells are not accessible in the PV module interconnection circuit a non-destructive test method was developed, which is based on partial shading of the test cell. This paper is a continuation of this work for thin-film PV modules in original size. The main difference to c-Si modules is that the sub-area required for IAM measurement cannot be related to a single cell, but must be related to a group of serially connected cells. Two test methods based on partial shading of a thin-film module have been studied, which both yield an IAM uncertainty better than ±0.01 in the angular range of ±75°. Comparative IAM measurements of commercial thin-film PV modules have shown only a slight variation of angular response curves. The associated spread in annual energy yield loss due to angular effects is less than 1% for the moderate climate of central Europe.