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Title:
 
Acceptable Volume of Investment for “Combined Stress Testing”
 
Author(s):
 
T. Tanahashi, M. Woodhouse, K. Sakurai, P. Hacke
 
Keywords:
 
Economic Analysis, Qualification and Testing, Reliability, Durability, c-Si PV module
 
Topic:
 
Photovoltaic Modules and BoS Components
Subtopic: PV Module Design, Manufacture, Performance and Reliability
Event: 36th European Photovoltaic Solar Energy Conference and Exhibition
Session: 4AV.1.46
 
Pages:
 
1091 - 1094
ISBN: 3-936338-60-4
Paper DOI: 10.4229/EUPVSEC20192019-4AV.1.46
 
Price:
 
 
0,00 EUR
 
Document(s): paper
 

Abstract/Summary:


The combined stress tests, in which some kinds of stressors simultaneously applied to the testing PV modules, have several advantages to contribute the risk avoidance on long-term operation of PV modules in fields (find the failure modes which are a-priori unknown in new module designs, reduction of potential risk, acceleration of the time to market of a product, and so on). Through the analyses for the cost-of-ownerships in the conventional qualification test and the proposed extended stress tests for PV modules, we predict that of a combined stress test, to clarify the acceptable level of investment for this novel test system. In this study, we demonstrate that, if we could develop the test equipment with a comparable cost to those required in these extended stress tests, the combined stress test would be accepted by all stake-holders in PV industry sector. Furthermore, it is suggested that the market penetration of this combined stress test would be facilitated by the equipment-improvement for the multi-module testing.