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Investigation of the Temperature Dependence of the Optical Properties of Silicon Nitride Anti-Reflection Coating on Silicon Photovoltaic Modules
M.F. Zhang, R. Bhoopathy, A. Gentle, Z. Hameiri
PECVD, Silicon-Nitride, Characterisation, Characterization, Optical Properties, Antireflection Coating
Silicon Materials and Cells
Subtopic: Characterisation & Simulation of Si Cells
Event: 36th European Photovoltaic Solar Energy Conference and Exhibition
Session: 2CV.2.64
392 - 395
ISBN: 3-936338-60-4
Paper DOI: 10.4229/EUPVSEC20192019-2CV.2.64
0,00 EUR
Document(s): paper


This study investigates the possible existence of a temperature dependence of the optical properties of silicon nitride anti-reflection coatings commonly used in photovoltaic modules. Despite the crucial importance of silicon nitride optical properties to the module’s performance, they have so far not been studied under typical module operating temperatures, which are considerably higher than room temperature. Using a state-of-the-art temperature-dependent ellipsometry technique, we characterise a range of silicon nitride antireflection coatings under both room temperature and approximately 90°C, a temperature in the range of the upper limit of a module’s operating temperature found in practice. For the first time, we demonstrate that, within the spectral range of 300 nm to 2500 nm, anti-reflection coating silicon nitride is optically stable in the investigated temperature range.