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Title:
 
Evaluation of Heterojunction Solar Cell Losses due to Half-Cell Processes
 
Author(s):
 
M. Turek, O. Breitenstein, S. Eiternick, S. Bharatula, S. Großer
 
Keywords:
 
Lock-in Thermography, Heterojunction Solar Cells, Efficiency Analysis, UV Degradation
 
Topic:
 
Silicon Materials and Cells
Subtopic: Low Temperature Route for Si Cells
Event: 37th European Photovoltaic Solar Energy Conference and Exhibition
Session: 2DV.3.2
 
Pages:
 
474 - 477
ISBN: 3-936338-73-6
Paper DOI: 10.4229/EUPVSEC20202020-2DV.3.2
 
Price:
 
 
0,00 EUR
 
Document(s): paper
 

Abstract/Summary:


Half-cell modules are a preferred technological option to produce high efficiency photovoltaic modules. In this work, we present results on different half-cell processes applied to state-of-the-art heterojunction solar cells. We show that for heterojunction solar cells, a well optimized cell separation process is necessary for reduced losses at the half-cell edge. The cell separation leads to additional depletion region recombination currents, which can be imaged and quantified by dark lock-in thermography (DLIT). To this end, we present a ‘Local I-V’ analysis that quantifies local electrical losses for different half-cell processes.