Title:	Evaluation of Heterojunction Solar Cell Losses due to Half-Cell Processes
Author(s):	M. Turek, O. Breitenstein, S. Eiternick, S. Bharatula, S. Großer
Keywords:	Lock-in Thermography, Heterojunction Solar Cells, Efficiency Analysis, UV Degradation
Topic:	Silicon Materials and Cells
Subtopic:	Low Temperature Route for Si Cells
Event:	37th European Photovoltaic Solar Energy Conference and Exhibition
Session:	2DV.3.2
Pages:	474 - 477
ISBN:	3-936338-73-6
Paper DOI:	10.4229/EUPVSEC20202020-2DV.3.2
Price:	0,00 EUR
Document(s):	paper

Abstract/Summary:

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Half-cell modules are a preferred technological option to produce high efficiency photovoltaic modules. In this work, we present results on different half-cell processes applied to state-of-the-art heterojunction solar cells. We show that for heterojunction solar cells, a well optimized cell separation process is necessary for reduced losses at the half-cell edge. The cell separation leads to additional depletion region recombination currents, which can be imaged and quantified by dark lock-in thermography (DLIT). To this end, we present a ‘Local I-V’ analysis that quantifies local electrical losses for different half-cell processes.