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Universal Measurement Protocol for Perovskite Based Photovoltaic Devices
G. Bardizza, H. Müllejans, D. Pavanello, E.D. Dunlop
Perovskites and Other Non-Silicon Materials, MJs and Tandems
Subtopic: Perovskites
Event: 37th European Photovoltaic Solar Energy Conference and Exhibition
Session: 3BO.10.2
ISBN: 3-936338-73-6
0,00 EUR
Document(s): presentation


A new protocol to measure perovskite photovoltaic devices (PSC) was developed. This protocol does not require prior information about the device and is universally applicable. It is particularly suitable to measure record devices as often there is no prior information on their behavior. The potential degradation under illumination is minimized, by measuring the most important parameter namely maximum power first and only afterwards determine the other I-V curve parameters. The protocol caters to account for device performance improvements due to light soaking while also testing for potential degradation. The measurement time at each voltage condition (required to obtain a full I-V curve) can easily be optimized by simple observation or a straightforward software routine. This protocol will lead to reliable determination of PSC device performance, which also is representative of their real world performance in a PV installation. The latter might not be achieved by more traditional I-V curves determined from voltage sweeps, where the device is inherently never under steady-state conditions.