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Geometric Optics at Nanotextured TCO Interfaces for Solar Cell Application
M. Schulte, S. Jorke, B. Pieters, H. Stiebig, K. Bittkau, U. Rau
Light Trapping, TCO, Scattering, SNOM
Thin Films Solar Cells
Subtopic: Amorphous and Microcrystalline Silicon Solar Cells
Event: 24th European Photovoltaic Solar Energy Conference, 21-25 September 2009, Hamburg, Germany
Session: 3BV.4.16
2804 - 2807
ISBN: 3-936338-25-6
Paper DOI: 10.4229/24thEUPVSEC2009-3BV.4.16
0,00 EUR
Document(s): paper


Light Trapping in thin film silicon solar cells is a challenge for the optical improvement of textured transparent conducting oxides (TCO). Scanning near-field optical microscopy (SNOM) is used for the experimental investigation of the microscopic scattering properties. To correlate structural features of the TCO film with the measured SNOM scattering intensities, we introduce a ray tracing model based on the TCO topography. For distances smaller than approximately 2.0 μm from the TCO surface the model can explain the most important scattering characteristics. The formation of intensity foci on a crater-like ZnO topography can be explained by the micro lens effect.