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Validation and Benchmarking of Energy Yield Framework for Thin-Film PV Technologies with Field Data
S. Ramesh, A. Tuomiranta, H. Badran, G.H. Yordanov, A. Hajjiah, B. Vermang, J. Poortmans
Evaluation, Simulation, CIGS, Modelling, Thin Film
Evolving and Emerging Technologies: Tandems; Thin Film absorbers; III-V; New Materials and Concepts; Advanced Modelling
Subtopic: CI(G)S, CdTe and Related Thin Films; Organic and Dye-Sensitised Devices
Event: 8th World Conference on Photovoltaic Energy Conversion
Session: 2DO.7.6
ISBN: 3-936338-86-8
0,00 EUR
Document(s): presentation


Photovoltaics (PV) industry has started focusing on Integrated photovoltaics (IPV), which has renewed the interest in thin-film PV technologies as they are more suitable for such applications than crystalline silicon (c-Si) solar cells. IMOMEC’s energy yield framework is one of the state-of-the-art frameworks available for simulating c-Si PV technology. In this work, we validate the developed thin-film CIGS electrical model to extend the energy yield framework’s capability to simulate thin-film CIGS PV technology. Validation is accomplished using the measurements from outdoor PV systems. The model performance is also benchmarked by comparing it with the performance of existing energy yield frameworks like System Advisory Model (SAM) and PVsyst.