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Title:
 
Fitting the Sub-Bandgap Reflectance of Textured Si Wafers
 
Author(s):
 
L. Abenante
 
Keywords:
 
Modelling / Modeling, Optical Properties
 
Topic:
 
Wafer-Based Silicon Solar Cells and Materials Technology
Subtopic: Mono- and Multicrystalline Silicon Materials and Cells
Event: 25th European Photovoltaic Solar Energy Conference and Exhibition / 5th World Conference on Photovoltaic Energy Conversion, 6-10 September 2010, Valencia, Spain
Session: 2CV.3.60
 
Pages:
 
2297 - 2298
ISBN: 3-936338-26-4
Paper DOI: 10.4229/25thEUPVSEC2010-2CV.3.60
 
Price:
 
 
0,00 EUR
 
Document(s): paper
 

Abstract/Summary:


It is presented an approach to fit the measured total external reflectance, RMEAS(), where is the wavelength, of Si wafers with textured surfaces, which takes into account possible destructive interference among the waves reflected at the front surface. An experimental check is performed. For actual Si wafers with textured surfaces, at sub-bandgap wavelengths, while measured transmittance is fitted at external front-surface reflectance, RF,E, higher than zero, RMEAS() is fitted at RF,E = 0.