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Investigation of Local Light Scattering Properties of SnO2 Substrates in Amorphous Silicon Solar Cells
K. Bittkau, T. Beckers, R. Carius, O. Agustsson, J. Schotsaert
Light Trapping, a-Si:H, Near-Field, SnO2
Thin Film Solar Cells
Subtopic: Amorphous and Microcrystalline Silicon Solar Cells
Event: 26th European Photovoltaic Solar Energy Conference and Exhibition
Session: 3AV.1.14
2495 - 2498
ISBN: 3-936338-27-2
Paper DOI: 10.4229/26thEUPVSEC2011-3AV.1.14
0,00 EUR
Document(s): paper


Local light scattering properties of the industrial transparent conductive oxide (TCO) AN10 is investigated with near-field scanning optical microscopy. Two different situations are compared. First, the TCO/air interface before the deposition of silicon and, second, the surface of a p-i-n layer stack of amorphous silicon on top of the TCO. The impact of the high refractive layer stack on the local light scattering is studied. Additionally, the light scattering is modeled taking into account the surface topography of the TCO. From this simulation, the angular distribution inside the silicon is analyzed.