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Title:
 
Simulation of Thin-Film Silicon Solar Cells with Integrated AFM Scans for Oblique Incident Waves
 
Author(s):
 
C. Jandl, K. Hertel, C. Pflaum, H. Stiebig
 
Keywords:
 
Thin Film Solar Cell, FIT Simulation, Oblique Incident Waves
 
Topic:
 
Thin Film Solar Cells
Subtopic: Amorphous and Microcrystalline Silicon Solar Cells
Event: 26th European Photovoltaic Solar Energy Conference and Exhibition
Session: 3AV.2.23
 
Pages:
 
2663 - 2666
ISBN: 3-936338-27-2
Paper DOI: 10.4229/26thEUPVSEC2011-3AV.2.23
 
Price:
 
 
0,00 EUR
 
Document(s): paper
 

Abstract/Summary:


A sophisticated light management is important for the overall performance of thin-film solar cells based on amorphous (a-Si:H) and microcrystalline (μc-Si:H) silicon. Thus, an important issue in designing high efficient solar cells is to optimize both light in-coupling and light trapping by improving the topology of the nanotextured interfaces. It is well known that a rough transparent conductive oxide (TCO) leads to an increase of the quantum efficiency (QE) and short-circuit current density (JSC). Improving the light trapping in a solar cell by manufacturing various TCO structures is a very complex process. Simulations are an inexpensive way to compare different structures without manufacturing a whole solar cell. Furthermore, thin-film solar cells are usually integrated in building facades, which leads to oblique incident sunlight of varying angles over the course of the day. To this end, a simulation tool for solving Maxwell’s equations based on the finite difference time domain (FDTD) method and the finite integration technique (FIT) is developed to calculate the efficiency of thin-film solar cells for oblique incident light. Parallel computations on high performance computers (HPC) are needed to meet the large computational requirements.