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Simulation of Thin-Film Silicon Solar Cells with Integrated AFM Scans for Oblique Incident Waves
C. Jandl, K. Hertel, C. Pflaum, H. Stiebig
Thin Film Solar Cell, FIT Simulation, Oblique Incident Waves
Thin Film Solar Cells
Subtopic: Amorphous and Microcrystalline Silicon Solar Cells
Event: 26th European Photovoltaic Solar Energy Conference and Exhibition
Session: 3AV.2.23
2663 - 2666
ISBN: 3-936338-27-2
Paper DOI: 10.4229/26thEUPVSEC2011-3AV.2.23
0,00 EUR
Document(s): paper


A sophisticated light management is important for the overall performance of thin-film solar cells based on amorphous (a-Si:H) and microcrystalline (μc-Si:H) silicon. Thus, an important issue in designing high efficient solar cells is to optimize both light in-coupling and light trapping by improving the topology of the nanotextured interfaces. It is well known that a rough transparent conductive oxide (TCO) leads to an increase of the quantum efficiency (QE) and short-circuit current density (JSC). Improving the light trapping in a solar cell by manufacturing various TCO structures is a very complex process. Simulations are an inexpensive way to compare different structures without manufacturing a whole solar cell. Furthermore, thin-film solar cells are usually integrated in building facades, which leads to oblique incident sunlight of varying angles over the course of the day. To this end, a simulation tool for solving Maxwell’s equations based on the finite difference time domain (FDTD) method and the finite integration technique (FIT) is developed to calculate the efficiency of thin-film solar cells for oblique incident light. Parallel computations on high performance computers (HPC) are needed to meet the large computational requirements.