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Title:
 
Early Detection of Potential Induced Degradation in the Field: Testing a New Methodology on Silicon PV Modules
 
Author(s):
 
M. Florides, G. Makrides, G.E. Georghiou
 
Keywords:
 
Detection, Shunt Resistance, Potential Induced Degradation, Photovoltaic (PV), Forward DC Resistance (FDCR)
 
Topic:
 
PV Systems and Storage – Modelling, Design, Operation and Performance
Subtopic: Operation, Performance and Maintenance of PV Systems
Event: 37th European Photovoltaic Solar Energy Conference and Exhibition
Session: 5DO.4.4
 
Pages:
 
1392 - 1395
ISBN: 3-936338-73-6
Paper DOI: 10.4229/EUPVSEC20202020-5DO.4.4
 
Price:
 
 
0,00 EUR
 
Document(s): paper
 

Abstract/Summary:


High voltage photovoltaic (PV) systems are affected by potential induced degradation (PID). PID detection by conventional data analysis methods could take a long time leading to unnoticed energy loss. If PID is detected at an early stage, energy loss could be avoided by taking the appropriate measures. This paper presents a new method for detecting PID at an early stage (< 1% power loss). The method is based on low current DC signals and, hence, it could be implemented in a low cost sensor. The method was tested experimentally on standard multicell crystalline silicon PV modules and successfully detected PID before 2% power loss.